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X-ray fluorescence device measures PVD coating thickness

Fischer Technology Inc. offers the FISCHERSCOPE® X-RAY XDLM®237, an X-ray fluorescence device for NDT of PVD coating on saws, drills, and dies. The unit combines the high-intensity beam of a microfocus tube with a small aperture and large detector window.

It features a 50-μm measurement spot and offers fast measurement times. It measures PVD layer thickness accurately, even on the finest cutting edges of high-end tools, according to the manufacturer. The instrument also can determine the base tool’s precise metallic composition, for instance, to determine cobalt leaching when an old coating is chemically removed before a new coating is applied.